Peter Pira
at Charles Univ
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 12 May 2015
Proc. SPIE. 9511, Damage to VUV, EUV, and X-ray Optics V
KEYWORDS: Lithium, Statistical analysis, Data modeling, Signal attenuation, Estimation theory, Laser induced fluorescence, Laser ablation, Extreme ultraviolet, Laser damage threshold, Pulsed laser operation

Proceedings Article | 3 May 2013
Proc. SPIE. 8777, Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
KEYWORDS: Polymethylmethacrylate, Data modeling, Silica, Silicon, Computer simulations, Laser ablation, Extreme ultraviolet, Laser damage threshold, Pulsed laser operation, Systems modeling

Proceedings Article | 23 May 2011
Proc. SPIE. 8077, Damage to VUV, EUV, and X-ray Optics III
KEYWORDS: Mirrors, Capillaries, Crystals, Dielectrics, Laser induced fluorescence, Laser ablation, Extreme ultraviolet, Digital image correlation, Laser crystals, Pulsed laser deposition

Proceedings Article | 18 May 2009
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Microscopes, Mirrors, Polymethylmethacrylate, Argon, Capillaries, Ions, Physics, Extreme ultraviolet, Spherical lenses, Plasma

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