Prof. Peter E.A. Pokrowsky
Doctor at FH Kaiserslautern
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Carbon, Thin films, Ellipsometry, Metals, X-rays, Hydrogen, Nitrogen, Magnetism, Raman spectroscopy, Optics manufacturing

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