Dr. Peter Sondhauss
at Max IV Lab
SPIE Involvement:
Publications (5)

Proceedings Article | 5 September 2014 Paper
Proceedings Volume 9209, 92090C (2014) https://doi.org/10.1117/12.2061007
KEYWORDS: Optical components, X-rays, Optical simulations, Electroluminescent displays, Computer simulations, X-ray optics, Crystals, Monochromators, Finite element methods, Human-machine interfaces

Proceedings Article | 15 February 2006 Paper
Peter Sondhauss, Jörgen Larsson, Michael Harbst, Graham Naylor, Anton Plech, Kees-Bertus Scheidt, Ola Synnergren, Michael Wulff, Justin Wark
Proceedings Volume 6118, 61180V (2006) https://doi.org/10.1117/12.641144
KEYWORDS: Phonons, Picosecond phenomena, Acoustics, Semiconductors, Heterojunctions, X-rays, Ultrafast phenomena, Interference (communication), X-ray diffraction, Semiconductor materials

Proceedings Article | 23 April 2001 Paper
Oldrich Renner, Olivier Peyrusse, P. Sondhauss, E. Krousky, Eckhart Foerster
Proceedings Volume 4424, (2001) https://doi.org/10.1117/12.425560
KEYWORDS: Plasma, Satellites, Aluminum, Ions, X-rays, Plasma spectroscopy, Spectroscopy, Laser applications, Plasma diagnostics, Laser spectroscopy

Proceedings Article | 25 January 2001 Paper
Justin Wark, A. Allen, P. Ansbro, Philip Bucksbaum, Zenghu Chang, Mark DeCamp, Roger Falcone, Philip Heimann, S. Johnson, Inuk Kang, Henry Kapteyn, Jorgen Larsson, Richard Lee, Aaron Lindenberg, Roberto Merlin, Thomas Missalla, G. Naylor, Howard Padmore, David Reis, K. Scheidt, Anders Sjoegren, P. Sondhauss, Michael Wulff
Proceedings Volume 4143, (2001) https://doi.org/10.1117/12.413690
KEYWORDS: Phonons, Crystals, X-rays, X-ray diffraction, Diffraction, Acoustics, Femtosecond phenomena, X-ray optics, Free electron lasers, Reflectivity

Proceedings Article | 18 September 1995 Paper
Claude Chenais-Popovics, Ovidiu Rancu, P. Renaudin, Jean-Claude Gauthier, F. Gilleron, O. Lindenmeyer, H. Kawagoshi, M. Dirksmoeller, Ingo Uschmann, Thomas Missalla, P. Sondhauss, Eckhart Foerster, Oldrich Renner, E. Krousky, Henri Pepin, O. Larroche, Olivier Peyrusse, Terry Shepard
Proceedings Volume 2523, (1995) https://doi.org/10.1117/12.220983
KEYWORDS: Plasma, Crystals, Spectrographs, Imaging spectroscopy, Ions, X-rays, Temperature metrology, Aluminum, X-ray imaging, Laser crystals

Conference Committee Involvement (2)
Advances in Computational Methods for X-Ray Optics IV
9 August 2017 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics III
19 August 2014 | San Diego, California, United States
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