Prof. Peter Svedlindh
Professor at Uppsala Univ
SPIE Involvement:
Conference Chair | Conference Program Committee | Author
Publications (3)

SPIE Conference Volume | 23 May 2005

Proceedings Article | 25 May 2004
Proc. SPIE. 5469, Fluctuations and Noise in Materials
KEYWORDS: Thin films, Copper, Diffusion, Resistance, Magnetism, Superconductors, Physics, Oxygen, Inductance, Temperature metrology

Proceedings Article | 9 May 2003
Proc. SPIE. 5112, Noise as a Tool for Studying Materials
KEYWORDS: Thin films, Quantum wells, Magnesium, Magnetism, Superconductors, Materials science, 3D metrology, Boron, Superconductivity, Temperature metrology

Conference Committee Involvement (5)
Fluctuations and Noise in Materials II
24 May 2005 | Austin, Texas, United States
Fluctuations and Noise in Materials
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise and Information in Nanoelectronics, Sensors, and Standards II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise as a Tool for Studying Materials
2 June 2003 | Santa Fe, New Mexico, United States
Noise and Information in Nanoelectronics, Sensors, and Standards
2 June 2003 | Santa Fe, New Mexico, United States
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