Dr. Peter Z. Takacs
Physicist Emeritus at Surface Metrology Solutions LLC
SPIE Involvement:
Conference Program Committee | Author | Editor
Area of Expertise:
optical metrology , surface profilometry , MTF of CCDs
Profile Summary

Peter Z. Takacs directs the activities of the Optical Metrology Laboratory in the Instrumentation Division of Brookhaven National Laboratory. He is actively involved in the development of instrumentation, methods, and standards used for testing the figure and finish of aspheric optics, such as those used for reflecting x-rays at grazing incidence, and in characterizing the performance of CCD sensors He received a BA from Rutgers University in 1969 and a PhD in physics from Johns Hopkins University in 1975.
Publications (84)

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Mirrors, X-ray optics, Sensors, Calibration, Glasses, Coating, Wavefronts, Distortion, Lens design, Optical beam profilers

Proceedings Article | 21 August 2020 Paper
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Point spread functions, Mirrors, Light sources, Metrology, Optical sensors, X-rays, Spatial resolution, Light, Diffraction gratings

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Point spread functions, Mirrors, X-ray optics, Metrology, Spatial frequencies, Sensors, Calibration, Beam shaping, Spatial resolution

Proceedings Article | 10 July 2018 Presentation + Paper
Proc. SPIE. 10705, Modeling, Systems Engineering, and Project Management for Astronomy VIII
KEYWORDS: Optical filters, Electronics, Imaging systems, Cameras, Quantum efficiency, Projection systems, Charge-coupled devices, Computer aided design, Large Synoptic Survey Telescope, Camera shutters

Proceedings Article | 6 July 2018 Paper
Proc. SPIE. 10702, Ground-based and Airborne Instrumentation for Astronomy VII
KEYWORDS: Electronics, Metrology, Cameras, Sensors, Control systems, Charge-coupled devices, Electro optics, Large Synoptic Survey Telescope, Electro-optic testing

Showing 5 of 84 publications
Proceedings Volume Editor (5)

SPIE Conference Volume | 26 September 2012

SPIE Conference Volume | 23 August 2010

SPIE Conference Volume | 13 September 2007

SPIE Conference Volume | 31 August 2005

Conference Committee Involvement (25)
Advances in Metrology for X-Ray and EUV Optics X
1 August 2021 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
EUV and X-ray Optics: Synergy between Laboratory and Space
26 April 2017 | Prague, Czech Republic
Showing 5 of 25 Conference Committees
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