Peter M. Thorne
Technical Manager at Leonardo MW Ltd
SPIE Involvement:
Author
Area of Expertise:
Electro-optics , Microelectronics , ROIC design , Systems Engineering
Profile Summary

Currently Technical Manager with broad responsibilities for technology and product based design and development. Previously, IC Design Team Leader completing over 40 silicon designs during last 15 years. Responsible for delivering company’s Silicon ROIC and other IC requirements from single element devices to long linear and large 2D staring arrays for use in a wide range of industrial, space and defence imaging and spectrometer applications.
Publications (11)

Proceedings Article | 18 June 2013 Paper
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared sensors, Mid-IR, Sensors, Silicon, Manufacturing, Diodes, Modulation transfer functions, Imaging arrays

Proceedings Article | 11 June 2013 Paper
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Readout integrated circuits, Infrared sensors, Mid-IR, Electronics, Cameras, Sensors, Photodiodes, Control systems, Semiconducting wafers, Flame detectors

Proceedings Article | 19 November 2012 Paper
Proc. SPIE. 8542, Electro-Optical Remote Sensing, Photonic Technologies, and Applications VI
KEYWORDS: Staring arrays, Readout integrated circuits, Thermography, Liquid phase epitaxy, Mercury cadmium telluride, Cameras, Sensors, Crystals, Gallium arsenide, Imaging arrays

Proceedings Article | 25 September 2012 Paper
Proc. SPIE. 8453, High Energy, Optical, and Infrared Detectors for Astronomy V
KEYWORDS: Readout integrated circuits, Avalanche photodetectors, Liquid phase epitaxy, Mercury cadmium telluride, Sensors, Video, Nondestructive evaluation, Wavefront sensors, Capacitance, Prototyping

Proceedings Article | 31 May 2012 Paper
Proc. SPIE. 8353, Infrared Technology and Applications XXXVIII
KEYWORDS: Staring arrays, Readout integrated circuits, Sensors, Metals, Gallium arsenide, Silicon, Diodes, Photomasks, Medium wave, Semiconducting wafers

Showing 5 of 11 publications
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