Peter S. Walecki
at Sunrise Optical LLC
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | March 9, 2015
Proc. SPIE. 9383, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XIX
KEYWORDS: Metrology, Light emitting diodes, Nickel, Manufacturing, Reflectivity, Surface roughness, Diffusers, Specular reflections, Optics manufacturing, Surface finishing

PROCEEDINGS ARTICLE | June 1, 2011
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Confocal microscopy, Microscopes, Mirrors, Multiphoton microscopy, Polarization, Reflection, Microscopy, Reflectivity, Objectives, Stimulated emission depletion microscopy

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top