Dr. Petr Šmíd
at Institute of Physics of Academy of Sciences
SPIE Involvement:
Author
Publications (13)

PROCEEDINGS ARTICLE | December 23, 2016
Proc. SPIE. 10142, 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
KEYWORDS: Chromatic aberrations, Point spread functions, Optical filters, Light sources, Imaging systems, Sensors, Fourier transforms, 3D modeling, Convolution, Systems modeling

PROCEEDINGS ARTICLE | December 18, 2012
Proc. SPIE. 8697, 18th Czech-Polish-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics
KEYWORDS: Gaussian beams, Speckle, Physics, Numerical simulations, Free space, Computer simulations, Speckle pattern, Wave propagation, Solids, Fractal analysis

PROCEEDINGS ARTICLE | December 15, 2010
Proc. SPIE. 7746, 17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
KEYWORDS: Diffraction, Gaussian beams, Speckle, Sensors, Surface roughness, Fourier transforms, Numerical simulations, Computer simulations, Speckle pattern, Light wave propagation

PROCEEDINGS ARTICLE | September 15, 2006
Proc. SPIE. 6341, Speckle06: Speckles, From Grains to Flowers
KEYWORDS: Statistical analysis, Speckle, Nickel, Reflectivity, Image resolution, CCD cameras, Speckle pattern, Velocity measurements, Light wave propagation, Light

PROCEEDINGS ARTICLE | February 1, 2006
Proc. SPIE. 6034, ICO20: Optical Design and Fabrication
KEYWORDS: Speckle, Sensors, Physics, Phase interferometry, CCD cameras, Speckle pattern, Image sensors, Optical interferometry, Lead, Light

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Speckle, Sensors, Physics, Optical testing, CCD cameras, Speckle pattern, Optoelectronics, Image sensors, Aluminum, Light

Showing 5 of 13 publications
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