Dr. Petra Aswendt
Marketing at ViALUX GmbH
SPIE Involvement:
Conference Program Committee | Author
Publications (20)

PROCEEDINGS ARTICLE | March 10, 2015
Proc. SPIE. 9376, Emerging Digital Micromirror Device Based Systems and Applications VII
KEYWORDS: Mirrors, Phase shifting, Switching, Photodiodes, 3D metrology, Projection systems, Micromirrors, Digital micromirror devices, Oscilloscopes, Digital Light Processing

PROCEEDINGS ARTICLE | May 30, 2013
Proc. SPIE. 8790, Optics for Arts, Architecture, and Archaeology IV
KEYWORDS: Fringe analysis, Statistical analysis, 3D acquisition, 3D image reconstruction, Cameras, Calibration, Clouds, 3D modeling, Chemical analysis, 3D image processing

PROCEEDINGS ARTICLE | May 30, 2013
Proc. SPIE. 8790, Optics for Arts, Architecture, and Archaeology IV
KEYWORDS: Hyperspectral imaging, Infrared imaging, Short wave infrared radiation, Databases, Raman spectroscopy, Data acquisition, Infrared radiation, Chemical analysis, Prototyping, 3D image processing

PROCEEDINGS ARTICLE | February 14, 2009
Proc. SPIE. 7210, Emerging Digital Micromirror Device Based Systems and Applications
KEYWORDS: Mirrors, Fringe analysis, 3D acquisition, Cameras, Receivers, Computer programming, 3D metrology, Projection systems, Analog electronics, Binary data

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Mirrors, Reflection, Cameras, Sensors, Calibration, Glasses, Inspection, Reflectivity, Phase measurement, Structured light

PROCEEDINGS ARTICLE | August 17, 2004
Proc. SPIE. 5458, Optical Micro- and Nanometrology in Manufacturing Technology
KEYWORDS: Microelectromechanical systems, Beam splitters, Deep ultraviolet, Modulation, Speckle, Ultraviolet radiation, Interferometry, Speckle pattern, Speckle interferometry, Laser interferometry

Showing 5 of 20 publications
Conference Committee Involvement (1)
Microsystems Engineering: Metrology and Inspection III
23 June 2003 | Munich, Germany
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