Dr. Petra Aswendt Profile

Dr. Petra Aswendt

Marketing at ViALUX GmbH

SPIE Involvement:

Author

Publications (21)

Proceedings Article | 4 March 2019 Presentation + Paper

Generating high-precision grayscale line profiles using DLP at maximum speed

Roland Höfling, Frank Leischnig, Sören Gärtner, Petra Aswendt

Proceedings Volume 10932, 109320H (2019) https://doi.org/10.1117/12.2506881

KEYWORDS: Industrial metrology, Digital Light Processing, Sensors, Phase shifting, Inspection, 3D metrology, Structured light

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Proceedings Article | 10 March 2015 Paper

Characteristics of digital micromirror projection for 3D shape measurement at extreme speed

Roland Höfling, Petra Aswendt, Frank Leischnig, Matthias Förster

Proceedings Volume 9376, 937608 (2015) https://doi.org/10.1117/12.2082525

KEYWORDS: 3D metrology, Digital Light Processing, Photodiodes, Micromirrors, Mirrors, Switching, Oscilloscopes, Phase shifting, Projection systems, Digital micromirror devices

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Proceedings Article | 30 May 2013 Paper

Deterioration estimation of paintings by means of combined 3D and hyperspectral data analysis

Luís Granero-Montagud, Cristina Portalés, Begoña Pastor-Carbonell, Emilio Ribes-Gómez, Antonio Gutiérrez-Lucas, Vivi Tornari, Vassilis Papadakis, Roger Groves, Beril Sirmacek, Alessandra Bonazza, Izabela Ozga, Jan Vermeiren, Koen van der Zanden, Matthias Föster, Petra Aswendt, Albert Borreman, Jon Ward, António Cardoso, Luís Aguiar, Filipa Alves, Polonca Ropret, José María Luzón-Nogué, Christian Dietz

Proceedings Volume 8790, 879008 (2013) https://doi.org/10.1117/12.2020336

KEYWORDS: 3D modeling, Clouds, Cameras, Chemical analysis, 3D image processing, 3D image reconstruction, 3D acquisition, Fringe analysis, Calibration, Statistical analysis

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Proceedings Article | 30 May 2013 Paper

SYDDARTA: new methodology for digitization of deterioration estimation in paintings

Proceedings Volume 8790, 879011 (2013) https://doi.org/10.1117/12.2020333

KEYWORDS: Prototyping, 3D image processing, Chemical analysis, Data acquisition, Hyperspectral imaging, Raman spectroscopy, Short wave infrared radiation, Databases, Infrared imaging, Infrared radiation

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Proceedings Article | 14 February 2009 Paper

Real-time 3D shape recording by DLP-based all-digital surface encoding

Roland Höfling, Petra Aswendt

Proceedings Volume 7210, 72100E (2009) https://doi.org/10.1117/12.807573

KEYWORDS: 3D metrology, Receivers, Cameras, Mirrors, Computer programming, Analog electronics, Fringe analysis, 3D acquisition, Binary data, Projection systems

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Proceedings Article | 13 June 2005 Paper

Industrial inspection of specular surfaces using a new calibration procedure

Petra Aswendt, Roland Hofling, Soren Gartner

Proceedings Volume 5856, (2005) https://doi.org/10.1117/12.621587

KEYWORDS: Cameras, Sensors, Reflectivity, Calibration, Inspection, Phase measurement, Reflection, Glasses, Mirrors, Structured light

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Proceedings Article | 17 August 2004 Paper

Analysis of static and dynamic operational behavior of active micromembranes

Petra Aswendt, Thierry Dean

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.547720

KEYWORDS: Speckle, Microelectromechanical systems, Interferometry, Speckle pattern, Beam splitters, Ultraviolet radiation, Speckle interferometry, Modulation, Laser interferometry, Deep ultraviolet

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Proceedings Article | 3 October 2003 Paper

Micromotion analysis by deep-UV speckle interferometry

Petra Aswendt

Proceedings Volume 5145, (2003) https://doi.org/10.1117/12.501638

KEYWORDS: Deep ultraviolet, Microelectromechanical systems, Speckle, Ultraviolet radiation, Speckle interferometry, Interferometers, Speckle pattern, Semiconductor lasers, Interferometry, Light sources

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Proceedings Article | 27 May 2003 Paper

Promise and challenge of DUV speckle interferometry

Petra Aswendt

Proceedings Volume 4933, (2003) https://doi.org/10.1117/12.516619

KEYWORDS: Deep ultraviolet, Microelectromechanical systems, Speckle, Speckle interferometry, Interferometers, Speckle pattern, Light sources, Interferometry, Image resolution, Speckle metrology

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Proceedings Article | 23 October 2001 Paper

Inspection system for MEMS characterization on wafer level using ESPI

Petra Aswendt, Claus-Dieter Schmidt, Dirk Zielke, Steffen Schubert

Proceedings Volume 4400, (2001) https://doi.org/10.1117/12.445604

KEYWORDS: Semiconducting wafers, Microelectromechanical systems, Chemical elements, Interferometry, Wafer testing, Manufacturing, Modulation, Inspection, Speckle pattern, Signal processing

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SPIE Journal Paper | 1 June 2001

Hologram reconstruction using a digital micromirror device

Thomas Kreis, Petra Aswendt, Roland Hoefling

OE, Vol. 40, Issue 06, (June 2001) https://doi.org/10.1117/12.10.1117/1.1367346

KEYWORDS: Digital micromirror devices, Holograms, Digital holography, Holographic interferometry, 3D image reconstruction, Micromirrors, Holography, Charge-coupled devices, Mirrors, Binary data

SPIE Journal Paper | 1 January 2000

Phase reflection: a new solution for the detection of shape defects on car body sheets

Roland Hoefling, Petra Aswendt, Reimund Neugebauer

OE, Vol. 39, Issue 01, (January 2000) https://doi.org/10.1117/12.10.1117/1.602349

KEYWORDS: Reflection, Scattering, Phase shifts, Phase measurement, Fringe analysis, Mirrors, Defect detection, Metals, Retroreflectors, Charge-coupled devices

Proceedings Article | 21 September 1999 Paper

Shape measurement in sheet metal formation: requirements and solutions

Roland Hoefling, Petra Aswendt, Reimund Neugebauer

Proceedings Volume 3824, (1999) https://doi.org/10.1117/12.364271

KEYWORDS: Metals, Digital micromirror devices, Charge-coupled devices, Optical testing, Time metrology, Switches, Algorithm development, Systems modeling, Phase shifts, CCD cameras

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Proceedings Article | 15 September 1999 Paper

Testing microcomponents by speckle interferometry

Petra Aswendt, Roland Hoefling, Karla Hiller

Proceedings Volume 3825, (1999) https://doi.org/10.1117/12.364298

KEYWORDS: Speckle, Multispectral imaging, Speckle interferometry, Interferometers, Speckle pattern, Interferometry, Sensors, Fringe analysis, Gyroscopes, Microelectromechanical systems

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Proceedings Article | 3 September 1999 Paper

Optical full-field technique for measuring deflection and strain on micromechanical components

Petra Aswendt, Roland Hoefling, Karla Hiller

Proceedings Volume 3875, (1999) https://doi.org/10.1117/12.360479

KEYWORDS: Speckle, Interferometry, Speckle pattern, Multispectral imaging, Microelectromechanical systems, Fringe analysis, Interferometers, Speckle interferometry, Sensors, Microscopes

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Proceedings Article | 29 September 1998 Paper

Experimental and numerical analysis of the thermal deformation of composite tubes

Daniel Holstein, Petra Aswendt, Roland Hoefling, Claus-Dieter Schmidt, Werner Jueptner

Proceedings Volume 3407, (1998) https://doi.org/10.1117/12.323351

KEYWORDS: Composites, 3D modeling, Interferometry, Holographic interferometry, Holography, Thermal modeling, Numerical analysis, Speckle interferometry, Finite element methods, Modeling

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Proceedings Article | 6 July 1998 Paper

Simulation and experiment on the thermal deformation of composite tubes

Daniel Holstein, Petra Aswendt, Roland Hoefling, Claus-Dieter Schmidt, Werner Jueptner

Proceedings Volume 3479, (1998) https://doi.org/10.1117/12.316457

KEYWORDS: Composites, 3D modeling, Holographic interferometry, Finite element methods, Interferometry, Holography, Modeling, Speckle interferometry, Optical simulations, Speckle pattern

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Proceedings Article | 18 August 1997 Paper

Application of a high-power diode laser for laser bending

Daniela Lopez Cutino, Joerg Dubslaff, Roland Hoefling, Petra Aswendt

Proceedings Volume 3097, (1997) https://doi.org/10.1117/12.281137

KEYWORDS: Semiconductor lasers, Metals, High power lasers, Laser systems engineering, Laser applications, Diodes, Laser processing, Continuous wave operation, Absorption, Image processing

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Proceedings Article | 18 September 1996 Paper

Steps towards the use of DSPI for high-temperature strain measurement

Petra Aswendt, Roland Hoefling

Proceedings Volume 2782, (1996) https://doi.org/10.1117/12.250740

KEYWORDS: Interferometry, Temperature metrology

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Proceedings Article | 14 June 1995 Paper

New approach to the optimization of HNDT applications

Petra Aswendt

Proceedings Volume 2544, (1995) https://doi.org/10.1117/12.211877

KEYWORDS: Fringe analysis, Holographic interferometry, Visibility, Shearography, Interferometry, Speckle interferometry, Holography, Speckle, Composites, Carbon

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