Petra Heger
at Fraunhofer IOF
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 February 2004 Paper
Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.511795
KEYWORDS: Silver, Absorption, Metals, Transmission electron microscopy, Multilayers, Optical properties, Surface plasmons, Dielectrics, Thin films, Optical testing

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