Ms. Petra Heger
at Fraunhofer IOF
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Thin films, Multilayers, Surface plasmons, Optical properties, Metals, Dielectrics, Silver, Optical testing, Transmission electron microscopy, Absorption

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