Prof. Petri Hirvonen
at Tampere Univ of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | March 1, 2005
Proc. SPIE. 5672, Image Processing: Algorithms and Systems IV
KEYWORDS: Human-machine interfaces, Calibration, Image segmentation, Particles, Electron microscopes, Scanning electron microscopy, Transmission electron microscopy, Fractal analysis, Analytical research, Atmospheric particles

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