Prof. Petri Hirvonen
at Tampere Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2005
Proc. SPIE. 5672, Image Processing: Algorithms and Systems IV
KEYWORDS: Particles, Atmospheric particles, Scanning electron microscopy, Human-machine interfaces, Electron microscopes, Transmission electron microscopy, Calibration, Image segmentation, Fractal analysis, Analytical research

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