Dr. Philip T. C. Chen
at NASA Goddard Space Flight Ctr
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (17)

PROCEEDINGS ARTICLE | July 22, 2016
Proc. SPIE. 9905, Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray
KEYWORDS: Electronics, Aerospace engineering, Sensors, Calibration, X-rays, X-rays, Silicon, Microcontrollers, Analog electronics, X-ray detectors, Signal detection

PROCEEDINGS ARTICLE | July 29, 2014
Proc. SPIE. 9144, Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray
KEYWORDS: Actuators, X-ray optics, Electronics, Sun, Stars, Sensors, X-rays, Space operations, X-ray detectors, Global Positioning System

PROCEEDINGS ARTICLE | September 7, 2006
Proc. SPIE. 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
KEYWORDS: Contamination, LIDAR, Laser induced damage, Laser applications, Laser development, Semiconductor lasers, Space operations, Pulsed laser operation, Contamination control, Space based lasers

PROCEEDINGS ARTICLE | July 7, 2006
Proc. SPIE. 6265, Space Telescopes and Instrumentation I: Optical, Infrared, and Millimeter
KEYWORDS: Telescopes, Stars, Sensors, Space telescopes, Spatial resolution, Planets, Infrared telescopes, Galactic astronomy, James Webb Space Telescope, Planetary systems

PROCEEDINGS ARTICLE | February 11, 2003
Proc. SPIE. 4853, Innovative Telescopes and Instrumentation for Solar Astrophysics
KEYWORDS: Sun, Imaging systems, Sensors, Calibration, Light scattering, Coronagraphy, Objectives, Charge-coupled devices, Space operations, Stray light

Showing 5 of 17 publications
Conference Committee Involvement (6)
Optical System Contamination: Effects, Measurements and Control IX
15 August 2006 | San Diego, California, United States
Optical System Contamination: Effects, Measurements, and Control VIII
2 August 2004 | Denver, Colorado, United States
Optical System Contamination: Effects, Measurements and Control VII
10 July 2002 | Seattle, WA, United States
Optical Systems Contamination and Degradation II: Effects, Measurements, and Control
2 August 2000 | San Diego, CA, United States
Rough Surface Scattering and Contamination
21 July 1999 | Denver, CO, United States
Showing 5 of 6 published special sections
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