Dr. Philip A. Heimann
at SLAC National Accelerator Lab
SPIE Involvement:
Conference Program Committee | Author
Publications (19)

Proceedings Article | 24 April 2019
Proc. SPIE. 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V
KEYWORDS: Cameras, Sensors, X-rays, Copper, Quantum efficiency, Diodes, Picosecond phenomena, X-ray detectors, Free electron lasers

Proceedings Article | 24 April 2019
Proc. SPIE. 11038, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V
KEYWORDS: Sensors, Calibration, X-rays, Free electron lasers, Power meters

Proceedings Article | 21 June 2017
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Photons, Electrons, Materials processing, Physics, Raman spectroscopy, Analytical research, Free electron lasers, States of matter, Stanford Linear Collider, Lead

Proceedings Article | 16 June 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Mirrors, Sensors, X-rays, Laser development, Reflectivity, Free electron lasers, Power meters, Stanford Linear Collider, Liquid crystal lasers, Temperature metrology

Proceedings Article | 30 September 2013
Proc. SPIE. 8849, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X
KEYWORDS: Diffraction, Mirrors, Optical design, Electron beams, X-rays, Spectral resolution, Monochromators, Free electron lasers, Liquid crystal lasers, Diffraction gratings

Proceedings Article | 30 September 2013
Proc. SPIE. 8849, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications X
KEYWORDS: Mirrors, Switches, Switching, X-rays, Control systems, Computer programming, X-ray imaging, Automatic control, Content addressable memory, Liquid crystal lasers

Showing 5 of 19 publications
Conference Committee Involvement (3)
Ultrafast X-Ray Sources and Detectors
26 August 2007 | San Diego, California, United States
Ultrafast X-Ray Detectors and Applications II
31 July 2005 | San Diego, California, United States
Ultrafast X-Ray Detectors and Applications
6 August 2003 | San Diego, California, United States
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