Dr. Philip C. D. Hobbs
Research Staff Member at IBM Thomas J Watson Research Ctr
SPIE Involvement:
Publications (6)

Proceedings Article | 27 December 2001
Proc. SPIE. 4563, Sensors and Controls for Intelligent Manufacturing II
KEYWORDS: Sensors, Ferroelectric polymers, Signal to noise ratio, Light emitting diodes, Multiplexers, Amplifiers, Infrared imaging, Diodes, Switches, Thermography

Proceedings Article | 29 December 1998
Proc. SPIE. 3520, Three-Dimensional Imaging, Optical Metrology, and Inspection IV
KEYWORDS: Semiconductor lasers, Scanners, 3D scanning, Printing, Wavefronts, Zone plates, Raster graphics, Actuators, Laser scanners, Diffraction gratings

Proceedings Article | 20 January 1997
Proc. SPIE. 2909, Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II
KEYWORDS: Particles, Sensors, Signal detection, Semiconducting wafers, Interference (communication), Signal to noise ratio, Photons, Plasma, Optical spheres, Light scattering

Proceedings Article | 4 August 1993
Proc. SPIE. 1926, Integrated Circuit Metrology, Inspection, and Process Control VII
KEYWORDS: Semiconducting wafers, Process control, Diffraction, Scanning electron microscopy, Deep ultraviolet, Photoresist materials, Photomasks, Critical dimension metrology, Sensors, Technetium

Proceedings Article | 1 July 1991
Proc. SPIE. 1435, Optical Methods for Ultrasensitive Detection and Analysis: Techniques and Applications
KEYWORDS: Absorption, Interference (communication), Semiconductor lasers, Modulation, Absorption spectroscopy, Spectroscopy, Optical amplifiers, Laser spectroscopy, Analog electronics, Signal detection

Showing 5 of 6 publications
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