Dr. Philip Melese
Chief Scientist at Trex Enterprises Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 June 2001 Paper
James Christofferson, Daryoosh Vashaee, Ali Shakouri, Philip Melese
Proceedings Volume 4275, (2001) https://doi.org/10.1117/12.429354
KEYWORDS: Thermography, Temperature metrology, Image processing, Semiconductors, Spatial resolution, Reflection, Sensors, Gold, Calibration, Silicon

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