Philipp A. Kirilenko
at St Petersburg State Polytech
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Mirrors, Digital filtering, Interferometry, Wavefronts, Semiconductor lasers, Gaussian filters, Laser stabilization, Diodes, Image filtering, Data fusion

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