Dr. Philippe Voarino
at Institut Fresnel
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | September 25, 2008
Proc. SPIE. 7102, Optical Fabrication, Testing, and Metrology III
KEYWORDS: Optical components, Antireflective coatings, Visible radiation, Reflection, Coating, Reflectivity, Control systems, Measurement devices, Aspheric lenses, Spectrophotometry

PROCEEDINGS ARTICLE | June 10, 2004
Proc. SPIE. 5273, Laser-Induced Damage in Optical Materials: 2003
KEYWORDS: Thin films, Refractive index, Silica, Laser induced damage, Particles, Dielectrics, Optical testing, Laser damage threshold, Spherical lenses, Absorption

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Optical components, Thin films, Silica, Laser induced damage, Particles, Dielectrics, Optical testing, Laser damage threshold, Thermal modeling, Absorption

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Thin films, Multilayers, Optical spheres, Silica, Scattering, Light scattering, Optical coatings, Laser scattering, Control systems, Mie scattering

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