Prof. Philip D. Rack Profile

Prof. Philip D. Rack

at Univ of Tennessee

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Author

Publications (7)

Proceedings Article | 8 March 2021 Presentation

In situ characterization of the laser-induced synthesis and photonic properties of nanostructures in a TEM

Chenze Liu, Yu-Chuan Lin, Yiling Yu, Yueying Wu, Alexander Puretzky, Mina Yoon, Gyula Eres, Christopher Rouleau, Philip Rack, Kai Xiao, Gerd Duscher, David Geohegan

Proceedings Volume 11675, 116750D (2021) https://doi.org/10.1117/12.2578719

KEYWORDS: Transmission electron microscopy, Laser crystals, Crystals, Crystallography, Heterojunctions, Spectroscopy, Pulsed laser deposition, Particles, Optical simulations, Materials science

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Proceedings Article | 5 March 2021 Presentation + Paper

In situ electron-beam processing and cathodoluminescence microscopy for quantum nanophotonics

Vasudevan Iyer, Scott Retterer, Jason Fowlkes, Stephen Jesse, Alexander Puretzky, Jordan Hachtel, Philip Rack, Benjamin Lawrie

Proceedings Volume 11675, 1167504 (2021) https://doi.org/10.1117/12.2578528

KEYWORDS: Nanophotonics, Microscopy, Plasmonics, Single photon, Nonlinear optics, Color centers, Structural design, Scanning electron microscopy, Quantum optics, Quantum information processing

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Proceedings Article | 21 April 2017 Presentation

Correlating the optical properties of WS2 monolayers grown by CVD with isoelectronic Mo doping level (Conference Presentation)

Kai Wang, Nick Cross, Abdelaziz Boulesbaa, Pushpa Pudasaini, Mengkun Tian, Masoud Mahjouri-Samani, Mark Oxley, Christopher Rouleau, Alexander Puretzky, Philip Rack, Kai Xiao, Mina Yoon, Gyula Eres, Gerd Duscher, David Geohegan

Proceedings Volume 10093, 1009305 (2017) https://doi.org/10.1117/12.2256543

KEYWORDS: Molybdenum, Doping, Optical properties, Chemical vapor deposition, Chemical species, Luminescence, Crystals, Transition metals, Ultrafast imaging, Absorption

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Proceedings Article | 17 April 2014 Paper

Evaluation of mask repair strategies via focused electron, helium, and neon beam induced processing for EUV applications

C. Gonzalez, W. Slingenbergh, R. Timilsina, J.-H. Noh, M. Stanford, B. Lewis, K. Klein, T. Liang, J. Fowlkes, P. Rack

Proceedings Volume 9048, 90480M (2014) https://doi.org/10.1117/12.2046712

KEYWORDS: Nickel, Helium, Neon, Ruthenium, Ions, Etching, Electron beams, Extreme ultraviolet, Transmission electron microscopy, Monte Carlo methods

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Proceedings Article | 15 September 2010 Paper

Conductive carbon nanotubes for semiconductor metrology

Victor Vartanian, Paul McClure, Vladimir Mancevski, Joseph Kopanski, Philp Rack, Ilona Sitnitsky, Matthew Bresin, Vince LaBella, Kathleen Dunn

Proceedings Volume 7767, 77670F (2010) https://doi.org/10.1117/12.861315

KEYWORDS: Resistance, Particle filters, Silicon, Metrology, Scanning probe microscopy, Scanning tunneling microscopy, Metals, Etching, Capacitance, Transmission electron microscopy

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Proceedings Article | 7 December 2004 Paper

Optically and electrically addressed carbon nanofiber electrode arrays for intracellular interfacing

Timothy McKnight, Anatoli Melechko, Guy Griffin, Seong-Ik Jun, Philip Rack, Michael Guillorn, Vladimir Merkulov, Michael Simpson

Proceedings Volume 5588, (2004) https://doi.org/10.1117/12.571375

KEYWORDS: Nanofibers, Electrodes, Carbon, Microfluidics, Plasma, Epoxies, Photomicroscopy, Microfabrication, Matrices, Chemical elements

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Proceedings Article | 2 June 2003 Paper

Soft electron beam etching for precision TEM sample preparation

Philip Rack, Alexander Thesen, Stephen Randolph, Jason Fowlkes, David Joy

Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.482822

KEYWORDS: Etching, Electron beams, Silicon, Transmission electron microscopy, Monte Carlo methods, Ion beams, Photomicroscopy, Ionization, Tungsten, Metrology

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Showing 5 of 7 publications

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