Dr. Piero Spezzigu
R&D Engineer at Intraspec Technologies
SPIE Involvement:
Area of Expertise:
Reliability , Photodetectors , Electronic measurements , Failure analysis , Space environment , Electronics Engineering
Publications (4)

Proceedings Article | 12 July 2019 Open Access Paper
O. Chassela, A. Grigoreiv, A. Fedorov, N. André, E Le-Comte, J. Rouzaud, P. Spezzigu
Proceedings Volume 11180, 1118030 (2019) https://doi.org/10.1117/12.2536027
KEYWORDS: Microchannel plates, Resistance, Sensors, Temperature metrology, Particles, Jupiter, Ceramics, Environmental sensing, Chemical species, Electrodes

Proceedings Article | 17 November 2017 Open Access Paper
Frédéric Bourcier, Robert Pansu, Delphine Faye, Patrice Le Nouy, Piero Spezzigu
Proceedings Volume 10563, 1056348 (2017) https://doi.org/10.1117/12.2304189
KEYWORDS: Luminescence, Molecules, Mirrors, Astronomical imaging, Adhesives, Absorption, Sensors, Ultraviolet radiation, Glasses, Hyperspectral imaging

Proceedings Article | 27 September 2016 Presentation + Paper
Frédéric Bourcier, Philippe Walter, Silvia Pedetti, Delphine Faye, Piero Spezzigu, Fulvio Infante, Patrice Le Nouy, Edoardo Zedda
Proceedings Volume 9952, 99520J (2016) https://doi.org/10.1117/12.2235592
KEYWORDS: Luminescence, Hyperspectral imaging, Ultraviolet radiation, Charge-coupled devices, Sensors, Spectroscopy, Prototyping, Prisms, Cadmium sulfide, Cadmium

Proceedings Article | 26 April 2008 Paper
Piero Spezzigu, Laurent Bechou, Gianandrea Quadri, Olivier Gilard, Yannick Deshayes, Yves Ousten, Massimo Vanzi
Proceedings Volume 7003, 70030O (2008) https://doi.org/10.1117/12.780976
KEYWORDS: Phototransistors, Silicon, Annealing, Reliability, Diffusion, Failure analysis, Manufacturing, Interfaces, Antireflective coatings, Photodiodes

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