Dr. Pierre M. Boher
Research & Development Manager at ELDIM
SPIE Involvement:
Conference Program Committee | Author
Profile Summary

Pierre Boher earned an Engineer degree at the ECP (Ecole Centrale des Arts et Manufactures) in 1982. After earning his Ph.D. in material sciences in 1984, he worked in the French Philips Laboratories during nine years on the deposition and characterization of very thin films and multilayers. R&D manager at SOPRA between 1995 and 2002, he participates to the development of different metrology tools for non destructive characterization mainly for microelectronics. He joined ELDIM in 2003 to be involved in the research and development of new metrology heads.
Publications (59)

Proceedings Article | 19 February 2018
Proc. SPIE. 10556, Advances in Display Technologies VIII
KEYWORDS: Organic light emitting diodes, Colorimetry, LCDs, Televisions, High dynamic range imaging, Fourier optics, CIE 1931 color space

Proceedings Article | 16 February 2017
Proc. SPIE. 10126, Advances in Display Technologies VII
KEYWORDS: CMOS sensors, Imaging systems, Sensors, Glasses, Robotics, Control systems, Optical testing, LCDs, Fourier optics, Quality systems, Stray light, Ferroelectric LCDs, High angular resolution imaging, Goniophotometry

Proceedings Article | 7 March 2016
Proc. SPIE. 9770, Advances in Display Technologies VI
KEYWORDS: Diffraction, Visualization, Organic light emitting diodes, Video, Reflectivity, Distortion, Computer simulations, Image quality, LCDs, Bidirectional reflectance transmission function, Ray tracing, Televisions, Light sources and illumination, Mathematics, Multimedia, Fourier optics, Flexible displays, Reflective displays

Proceedings Article | 13 March 2015
Proc. SPIE. 9398, Measuring, Modeling, and Reproducing Material Appearance 2015
KEYWORDS: Backscatter, Reflection, Sensors, Reflectivity, Polarizers, LCDs, Bidirectional reflectance transmission function, Collimation, Spatial resolution, Fourier optics

Proceedings Article | 11 March 2015
Proc. SPIE. 9385, Advances in Display Technologies V
KEYWORDS: Eye, Imaging systems, Organic light emitting diodes, Polymers, Linear filtering, Iris, Multispectral imaging, Fourier optics, OLED lighting, Bandpass filters

Proceedings Article | 6 March 2014
Proc. SPIE. 9011, Stereoscopic Displays and Applications XXV
KEYWORDS: Eye, Imaging systems, Cameras, Image resolution, Iris, 3D metrology, Spatial resolution, Fourier optics, 3D displays, CCD image sensors

Showing 5 of 59 publications
Conference Committee Involvement (9)
Advances in Display Technologies X
1 February 2020 | San Francisco, California, United States
Advances in Display Technologies IX
7 February 2019 | San Francisco, California, United States
Advances in Display Technologies VIII
31 January 2018 | San Francisco, California, United States
Advances in Display Technologies VII
2 February 2017 | San Francisco, California, United States
Advances in Display Technologies VI
18 February 2016 | San Francisco, California, United States
Showing 5 of 9 published special sections
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