Prof. Pierre M. Jacquot
Group Leader at Ecole Polytechnique Fédérale de Lausanne
SPIE Involvement:
Author
Publications (20)

Proceedings Article | 14 September 2010
Proc. SPIE. 7387, Speckle 2010: Optical Metrology
KEYWORDS: Refractive index, Modulation, Visualization, Speckle, Water, Glasses, Wavelets, Phase shift keying, Speckle interferometry, Liquids

Proceedings Article | 14 September 2010
Proc. SPIE. 7387, Speckle 2010: Optical Metrology
KEYWORDS: Modulation, Speckle, Signal attenuation, Fourier transforms, Interferometry, Phase shift keying, Speckle interferometry, Signal processing, Spatial resolution, Binary data

Proceedings Article | 9 September 2008
Proc. SPIE. 7038, Optical Trapping and Optical Micromanipulation V
KEYWORDS: Microscopes, Microfluidics, Microlens array, Chemical species, Particles, Interferometry, Spatial light modulators, Optical tweezers, Micromirrors, Optical arrays

Proceedings Article | 15 September 2006
Proc. SPIE. 6341, Speckle06: Speckles, From Grains to Flowers
KEYWORDS: Signal to noise ratio, Speckle, Fourier transforms, Free space, Computer simulations, Speckle pattern, Speckle interferometry, Diffusers, Convolution, Statistical modeling

Proceedings Article | 11 September 2006
Proc. SPIE. 6326, Optical Trapping and Optical Micromanipulation III
KEYWORDS: Microscopes, Mirrors, Microfluidics, Interferometers, Glasses, Particles, Interfaces, Optical tweezers, Relays, Phase shifts

Showing 5 of 20 publications
Conference Committee Involvement (11)
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection
23 May 2011 | Munich, Germany
Interferometry XV: Applications
3 August 2010 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection
16 June 2009 | Munich, Germany
Interferometry XIV: Applications
13 August 2008 | San Diego, California, United States
Showing 5 of 11 Conference Committees
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