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Two of these channels are high resolution imagers (HRI) at respectively 17.1 nm (HRI-EUV) and 121.6 nm (HRI-Ly∝), each one composed of two off-axis aspherical mirrors. The third channel is a full sun imager (FSI) composed of one single off-axis aspherical mirror and working at 17.1 nm and 30.4 nm alternatively. This paper presents the optical alignment of each telescope.
The alignment process involved a set of Optical Ground Support Equipment (OGSE) such as theodolites, laser tracker, visible-light interferometer as well as a 3D Coordinates Measuring Machine (CMM).
The mirrors orientation have been measured with respect to reference alignment cubes using theodolites. Their positions with respect to reference pins on the instrument optical bench have been measured using the 3D CMM. The mirrors orientations and positions have been adjusted by shimming of the mirrors mount during the alignment process.
After this mechanical alignment, the quality of the wavefront has been checked by interferometric measurements, in an iterative process with the orientation and position adjustment to achieve the required image quality.
LYRA demonstrates technologies important for future missions such as the ESA Solar Orbiter.
The current state-of-the-art commercial metrology systems are not able to measure these types of reflectors because they have to face the measurement of shape and waviness over relatively large areas with a large deformation dynamic range and encompassing a wide range of spatial frequencies. 3-D metrology (tactile coordinate measurement) machines are generally used during the manufacturing process. Unfortunately, these instruments cannot be used in the operational environmental conditions of the reflector.
The application of standard visible wavelength interferometric methods is very limited or impossible due to the large relative surface roughnesses involved. A small number of infrared interferometers have been commercially developed over the last 10 years but their applications have also been limited due to poor dynamic range and the restricted spatial resolution of their detectors. These restrictions affect also the surface error slopes that can be captured and makes their application to surfaces manufactured using CRFP honeycomb technologies rather difficult or impossible.
It has therefore been considered essential, from the viewpoint of supporting future ESA exploration missions, to develop and realise suitable verification tools based on infrared interferometry and other optical techniques for testing large reflector structures, telescope configurations and their performances under simulated space conditions.
Two methods and techniques are developed at CSL.
The first one is an IR-phase shifting interferometer with high spatial resolution. This interferometer shall be used specifically for the verification of high precision IR, FIR and sub-mm reflector surfaces and telescopes under both ambient and thermal vacuum conditions.
The second one presented hereafter is a holographic method for relative shape measurement. The holographic solution proposed makes use of a home built vacuum compatible holographic camera that allows displacement measurements from typically 20 nanometres to 25 microns in one shot. An iterative process allows the measurement of a total of up to several mm of deformation. Uniquely the system is designed to measure both specular and diffuse surfaces.
Due to the orbit of the spacecraft (low altitude polar orbit) and even if the observations are performed in a direction perpendicular to orbit plane, the measurements can be disturbed by the straylight reflected by the earth (albedo) that can generate a periodic perturbation.
The paper details the overall optical design of the baffle. The baffle modelling and straylight computation methods are described and the expected performances are discussed.
The HRI channel is based on a compact two mirrors off-axis design. The spectral selection is obtained by a multilayer coating deposited on the mirrors and by redundant Aluminum filters rejecting the visible and infrared light. The detector is a 2k x 2k array back-thinned silicon CMOS-APS with 10 μm pixel pitch, sensitive in the EUV wavelength range.
Due to the instrument compactness and the constraints on the optical design, the channel performance is very sensitive to the manufacturing, alignments and settling errors. A trade-off between two optical layouts was therefore performed to select the final optical design and to improve the mirror mounts. The effect of diffraction by the filter mesh support and by the mirror diffusion has been included in the overall error budget. Manufacturing of mirror and mounts has started and will result in thermo-mechanical validation on the EUI instrument structural and thermal model (STM).
Because of the limited channel entrance aperture and consequently the low input flux, the channel performance also relies on the detector EUV sensitivity, readout noise and dynamic range. Based on the characterization of a CMOS-APS back-side detector prototype, showing promising results, the EUI detector has been specified and is under development. These detectors will undergo a qualification program before being tested and integrated on the EUI instrument.
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