Dr. Piet Bijl
Senior Research Scientist at TNO Earth Life & Social Sciences
SPIE Involvement:
Fellow status | Conference Program Committee | Author
Area of Expertise:
human vision , psychophysics , sensor performance , electro-optics , target acquisition , thermal imagers
Websites:
Profile Summary

Piet Bijl currently works as a programme leader and senior specialist at the Perceptual & Cognitive Systems Department of TNO Behavioural and Societal Sciences in The Netherlands. He received his Ph.D. in physics from the University of Utrecht in The Netherlands in 1991. Research experience includes Target Acquisition, psychophysics, visual contrast detection, object recognition and visual search, and characterization of optical and electro-optical (E/O) system performance with the human-in-the-loop. He developed the (patented) TOD test method to quantify E/O system performance for staring array and scanning camera systems including CCD cameras, thermal imagers and X-ray screening systems. He has published over 60 articles and TNO reports on these topics. He is involved in developing test procedures for complex imaging systems, including multi-band systems and systems with image enhancement or compression techniques and in the development of new standard video and thermal camera system performance specification methodologies. He is Program Committee Member of the DSS symposium on Infrared Imaging Systems; Design, Analysis, Modeling, and Testing, Member of NATO JCGISR Team of Experts Electro Optics working on STANAG 4347-4351 updates, Member of an international committee on the characterization of complex imaging systems, Guest Editor of the Optical Engineering journal, and was Topical Editor of the Psychophysics Section of the Marcel Dekker Encyclopedia of Optical Engineering. For his contributions in the field of Electro-Optics he was elected Fellow of SPIE in 2010.
Publications (57)

PROCEEDINGS ARTICLE | October 6, 2017
Proc. SPIE. 10433, Electro-Optical and Infrared Systems: Technology and Applications XIV
KEYWORDS: Imaging systems, Cameras, Sensors, Signal processing, Target acquisition, Performance modeling, Atmospheric modeling, Electro optical modeling, Systems modeling

PROCEEDINGS ARTICLE | October 5, 2017
Proc. SPIE. 10432, Target and Background Signatures III
KEYWORDS: Visual process modeling, Cameras, Sensors, Target acquisition, Atmospheric sensing, Performance modeling, Thermal modeling, Atmospheric modeling, Electro optical modeling, Systems modeling

PROCEEDINGS ARTICLE | May 3, 2017
Proc. SPIE. 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
KEYWORDS: Signal to noise ratio, Super resolution, Data modeling, Visualization, Imaging systems, Sensors, Image processing, Sensor performance, Image sensors, Image contrast enhancement, Target acquisition, Performance modeling, Electro optical modeling, Systems modeling

PROCEEDINGS ARTICLE | May 3, 2017
Proc. SPIE. 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
KEYWORDS: Thermography, Imaging systems, Sensors, Signal processing, Target acquisition, Performance modeling, Thermal modeling, Atmospheric modeling, Electro optical modeling, Systems modeling

PROCEEDINGS ARTICLE | October 21, 2016
Proc. SPIE. 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII
KEYWORDS: Eye, Data modeling, Visualization, Imaging systems, Sensors, Performance modeling, Eye models, Thermal modeling, Electro optical modeling, Systems modeling

PROCEEDINGS ARTICLE | October 21, 2016
Proc. SPIE. 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII
KEYWORDS: Eye, Visualization, Imaging systems, Spatial frequencies, Target acquisition, Contrast transfer function, Atmospheric modeling, Electro optical modeling, Systems modeling, Targeting Task Performance metric

Showing 5 of 57 publications
Conference Committee Involvement (23)
Electro-Optical and Infrared Systems: Technology and Applications
10 September 2018 | Berlin, Germany
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
17 April 2018 | Orlando, Florida, United States
Electro-Optical and Infrared Systems: Technology and Applications
13 September 2017 | Warsaw, Poland
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
11 April 2017 | Anaheim, California, United States
Electro-Optical and Infrared Systems: Technology and Applications
28 September 2016 | Edinburgh, United Kingdom
Showing 5 of 23 published special sections
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