Dr. Piet Bijl
Senior Research Scientist at TNO Defence Safety & Security
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
human vision , psychophysics , sensor performance , electro-optics , target acquisition , thermal imagers
Websites:
Profile Summary

Piet Bijl currently works as a programme leader and senior specialist at the Perceptual & Cognitive Systems Department of TNO Behavioural and Societal Sciences in The Netherlands. He received his Ph.D. in physics from the University of Utrecht in The Netherlands in 1991. Research experience includes Target Acquisition, psychophysics, visual contrast detection, object recognition and visual search, and characterization of optical and electro-optical (E/O) system performance with the human-in-the-loop. He developed the (patented) TOD test method to quantify E/O system performance for staring array and scanning camera systems including CCD cameras, thermal imagers and X-ray screening systems. He has published over 60 articles and TNO reports on these topics. He is involved in developing test procedures for complex imaging systems, including multi-band systems and systems with image enhancement or compression techniques and in the development of new standard video and thermal camera system performance specification methodologies. He is Program Committee Member of the DSS symposium on Infrared Imaging Systems; Design, Analysis, Modeling, and Testing, Member of NATO JCGISR Team of Experts Electro Optics working on STANAG 4347-4351 updates, Member of an international committee on the characterization of complex imaging systems, Guest Editor of the Optical Engineering journal, and was Topical Editor of the Psychophysics Section of the Marcel Dekker Encyclopedia of Optical Engineering. For his contributions in the field of Electro-Optics he was elected Fellow of SPIE in 2010.
Publications (61)

Proceedings Article | 9 October 2019
Proc. SPIE. 11153, Environmental Effects on Light Propagation and Adaptive Systems II
KEYWORDS: Optical sensors, Detection and tracking algorithms, Detector development, Turbulence, Modulation transfer functions, Electro optical systems, Electro optics, Algorithm development, Atmospheric propagation, Atmospheric sensing

Proceedings Article | 9 October 2019
Proc. SPIE. 11159, Electro-Optical and Infrared Systems: Technology and Applications XVI
KEYWORDS: Thermography, Infrared imaging, Visual process modeling, Data modeling, Imaging systems, Computer simulations, Performance modeling, Thermal modeling, Atmospheric modeling, Instrument modeling

Proceedings Article | 14 May 2019
Proc. SPIE. 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
KEYWORDS: Signal to noise ratio, Imaging systems, Cameras, Sensors, Image sensors, Zoom lenses, Performance modeling, Electro optical modeling, Systems modeling

Proceedings Article | 9 October 2018
Proc. SPIE. 10795, Electro-Optical and Infrared Systems: Technology and Applications XV
KEYWORDS: Signal to noise ratio, Imaging systems, Sensors, Image processing, Image sensors, Signal processing, Modulation transfer functions, Performance modeling, Electro optical modeling, Systems modeling

Proceedings Article | 6 October 2017
Proc. SPIE. 10433, Electro-Optical and Infrared Systems: Technology and Applications XIV
KEYWORDS: Imaging systems, Cameras, Sensors, Signal processing, Target acquisition, Performance modeling, Atmospheric modeling, Electro optical modeling, Systems modeling

Showing 5 of 61 publications
Conference Committee Involvement (28)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXII
11 April 2021 | Orlando, Florida, United States
Electro-optical and Infrared Systems: Technology and Applications XVII
22 September 2020 | Online Only, United Kingdom
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI
27 April 2020 | Online Only, California, United States
Electro-Optical and Infrared Systems: Technology and Applications XVI
11 September 2019 | Strasbourg, France
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
16 April 2019 | Baltimore, Maryland, United States
Showing 5 of 28 Conference Committees
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