Pieter J. M. Kerstens
at KLA Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 August 1992 Paper
Proc. SPIE. 1661, Machine Vision Applications in Character Recognition and Industrial Inspection
KEYWORDS: Analog electronics, Amplifiers, Charge-coupled devices, Calibration, Error analysis, Inspection, Quantization, Digital signal processing, CCD cameras, Optical amplifiers

Proceedings Article | 1 March 1992 Paper
Proc. SPIE. 1708, Applications of Artificial Intelligence X: Machine Vision and Robotics
KEYWORDS: Confocal microscopy, Deconvolution, Inspection, Image processing, Evolutionary algorithms, Signal detection, Electronic filtering, Signal processing, Microscopes, Machine vision

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top