Pieter J. M. Kerstens
at KLA Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 August 1992
Proc. SPIE. 1661, Machine Vision Applications in Character Recognition and Industrial Inspection
KEYWORDS: Digital signal processing, Optical amplifiers, Calibration, Error analysis, Inspection, Amplifiers, CCD cameras, Quantization, Charge-coupled devices, Analog electronics

Proceedings Article | 1 March 1992
Proc. SPIE. 1708, Applications of Artificial Intelligence X: Machine Vision and Robotics
KEYWORDS: Confocal microscopy, Microscopes, Image processing, Inspection, Signal processing, Machine vision, Deconvolution, Electronic filtering, Signal detection, Evolutionary algorithms

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