Pin Wang
at Nanyang Technological Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 3 October 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Wafer-level optics, Semiconductors, Phase shifting, Photoelasticity, Calibration, Silicon, Infrared radiation, Stress analysis, Semiconducting wafers, Phase shifts

Proceedings Article | 3 October 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Visible radiation, Phase shifting, Photoelasticity, Imaging systems, Calibration, Image processing, Laser induced damage, Polarimetry, Epoxies, Phase shifts

Proceedings Article | 25 April 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Aerospace engineering, Birefringence, Polarizers, Wave plates, Image analysis, LCDs, Liquid crystals, Optical alignment, Phase shifts, Light

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