Miss Ping Xu
at China Jiliang University
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Ray tracing, Wavefronts, Testing and analysis, Glasses, Deflectometry

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Calibration, Deflectometry, Ray tracing, Reverse modeling

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