Dr. Ping Zhong
at Donghua Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (6)

PROCEEDINGS ARTICLE | November 25, 2009
Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
KEYWORDS: Imaging systems, Image segmentation, Computing systems, Control systems, Image quality, Transmittance, High dynamic range imaging, Image enhancement, Charge-coupled devices, CCD image sensors

PROCEEDINGS ARTICLE | November 20, 2009
Proc. SPIE. 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Sun, Sensors, Silicon, Amplifiers, Receivers, Computer programming, Head, Data processing, Signal processing, Measurement devices

PROCEEDINGS ARTICLE | August 31, 2009
Proc. SPIE. 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging
KEYWORDS: Image compression, Digital image processing, Image processing, Computing systems, Control systems, Image quality, High dynamic range imaging, Image enhancement, Associative arrays, Charge-coupled devices

PROCEEDINGS ARTICLE | November 27, 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Moire patterns, Fringe analysis, 3D acquisition, 3D image reconstruction, Image processing, Distortion, Image analysis, 3D metrology, Microelectronics, 3D image processing

PROCEEDINGS ARTICLE | November 27, 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Moire patterns, Fringe analysis, Digital image processing, Detection and tracking algorithms, Image processing, Digital filtering, Image filtering, Image enhancement, Binary data, 3D image processing

PROCEEDINGS ARTICLE | February 8, 2005
Proc. SPIE. 5637, Electronic Imaging and Multimedia Technology IV
KEYWORDS: Imaging systems, Cameras, Image processing, Video, Image filtering, Airborne reconnaissance, Motion models, Motion measurement, Motion estimation, Affine motion model

Showing 5 of 6 publications
Conference Committee Involvement (3)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
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