Dr. Ping Zhong
at Donghua Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (6)

Proceedings Article | 25 November 2009
Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
KEYWORDS: Imaging systems, Image segmentation, Computing systems, Control systems, Image quality, Transmittance, High dynamic range imaging, Image enhancement, Charge-coupled devices, CCD image sensors

Proceedings Article | 20 November 2009
Proc. SPIE. 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Sun, Sensors, Silicon, Amplifiers, Receivers, Computer programming, Head, Data processing, Signal processing, Measurement devices

Proceedings Article | 31 August 2009
Proc. SPIE. 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging
KEYWORDS: Image compression, Digital image processing, Image processing, Computing systems, Control systems, Image quality, High dynamic range imaging, Image enhancement, Associative arrays, Charge-coupled devices

Proceedings Article | 27 November 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Moire patterns, Fringe analysis, 3D acquisition, 3D image reconstruction, Image processing, Distortion, Image analysis, 3D metrology, Microelectronics, 3D image processing

Proceedings Article | 27 November 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Moire patterns, Fringe analysis, Digital image processing, Detection and tracking algorithms, Image processing, Digital filtering, Image filtering, Image enhancement, Binary data, 3D image processing

Showing 5 of 6 publications
Conference Committee Involvement (5)
Optical Metrology and Inspection for Industrial Applications VII
11 October 2020 | Beijing, China
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top