Dr. Piotr Edelman
Chief Scientist at Semilab SDI LLC
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 27 August 1998 Paper
Piotr Edelman, A. Savchouk, M. Wilson, Lubek Jastrzebski, Jacek Lagowski, Christopher Nauka, Shawming Ma, Andrew Hoff, Damon DeBusk
Proceedings Volume 3509, (1998) https://doi.org/10.1117/12.324400
KEYWORDS: Semiconducting wafers, Plasma, Oxides, Metals, Etching, Interfaces, Plasma etching, Vestigial sideband modulation, Semiconductors, Silicon

Proceedings Article | 13 September 1996 Paper
Lubek Jastrzebski, Piotr Edelman, Jacek Lagowski, Andrew Hoff, A. Savchouk, Eric Persson
Proceedings Volume 2877, (1996) https://doi.org/10.1117/12.250934
KEYWORDS: Oxides, Ions, Sodium, Semiconducting wafers, Molybdenum, Contamination, Interfaces, Diagnostics, Capacitors, Temperature metrology

Proceedings Article | 14 September 1994 Paper
Piotr Edelman, Andrew Hoff, Lubek Jastrzebski, Jacek Lagowski
Proceedings Volume 2337, (1994) https://doi.org/10.1117/12.186641
KEYWORDS: Oxides, Ions, Semiconducting wafers, Sodium, Electrodes, Semiconductors, Silicon, Contamination, Interfaces, Annealing

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