Dr. Po-Chi Sung
Postdoctoral Researcher at National Tsing Hua Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Thin films, Light sources, Photoelasticity, Birefringence, Reflection, Calibration, Glasses, Spectroscopy, Crystals, Manufacturing, Inspection, Optical testing

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