Pol Martínez
at Sensofar Tech SL
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 24, 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Confocal microscopy, Microscopes, Monochromatic aberrations, Cameras, Calibration, Error analysis, 3D image processing

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