Pooran C. Joshi
at Oak Ridge National Lab
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 19 July 2016
JPE Vol. 6 Issue 03
KEYWORDS: Resistance, Adsorption, Humidity, Crystals, Scanning probe microscopy, Oxides, Oxygen, Scanning electron microscopy, Surface roughness, Metals

Proceedings Article | 27 February 2016
Proc. SPIE. 9749, Oxide-based Materials and Devices VII
KEYWORDS: Thin films, Sensors, Oxygen, Humidity, Thin film devices, Nanoparticles, Gas sensors, Oxides, Pulsed laser deposition, Polymeric sensors, Resistance, Adsorption, Crystals, Scanning electron microscopy, Argon, Metals

Proceedings Article | 16 May 2003
Proc. SPIE. 5004, Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas
KEYWORDS: Thin films, Oxides, Dielectrics, Capacitors, Refractive index, Thin film devices, Plasma, Plasma enhanced chemical vapor deposition, Molybdenum, Thin film deposition

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