Pranab Sabitru Naik
at Univ of Hong Kong
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 18, 2004
Proc. SPIE. 5297, Real-Time Imaging VIII
KEYWORDS: Imaging systems, Sensors, Spectroscopy, Germanium, Magnetism, Data acquisition, Image quality, Aluminum, Raster graphics, Semiconducting wafers

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