Dr. Prateek Jain
at Synopsys Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 28, 2009
Proc. SPIE. 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X
KEYWORDS: Signal to noise ratio, Imaging systems, Cameras, Sensors, Image processing, Electrons, Charge-coupled devices, Array processing, Performance modeling, Systems modeling

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