Ms. Priya Dwivedi
Doctoral Candidate at Technische Univ Delft
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Microscopes, Diffraction, Coherence imaging, Electron beams, Error analysis, X-rays, Image restoration, Fourier transforms, Electron microscopes, Phase retrieval, Reconstruction algorithms, X-ray imaging

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