Puja Kadkhoda
Research Scientist/Thin Film Technology at Laser Zentrum Hannover eV
SPIE Involvement:
Area of Expertise:
Total Scattering , DUV/VUV-spectrometry , Angle Resolved Scattering , Thermal shift
Publications (13)

Proceedings Article | 17 June 2024 Presentation + Paper
Proceedings Volume 13021, 130210I (2024) https://doi.org/10.1117/12.3021963
KEYWORDS: Nitrogen, Absorption, Vacuum, Spectroscopy, Molecules, Reflectivity, Photovoltaics, Photomultipliers, Deep ultraviolet, Contamination

Proceedings Article | 24 September 2015 Paper
Proceedings Volume 9628, 96280N (2015) https://doi.org/10.1117/12.2191311
KEYWORDS: Luminescence, Deep ultraviolet, Scattering, Optical components, Laser scattering, Sensors, Silica, Calibration, Pulsed laser operation, Near infrared

Proceedings Article | 13 November 2014 Paper
Proceedings Volume 9237, 923708 (2014) https://doi.org/10.1117/12.2069226
KEYWORDS: Particles, Scattering, Microscopy, Laser scattering, Optical coatings, Optical components, Reflectivity, Scatter measurement, Inspection, Coating equipment

Proceedings Article | 24 May 2013 Paper
P. Kadkhoda, P. Chubak, M. Lassahn, D. Ristau
Proceedings Volume 8791, 87911C (2013) https://doi.org/10.1117/12.2018999
KEYWORDS: Scattering, Optical components, Microscopy, Inspection, Phase contrast, Laser scattering, Particles, Scatter measurement, Reflectivity, Defect detection

Proceedings Article | 17 June 2009 Paper
P. Kadkhoda, W. Sakiew, S. Günster, D. Ristau
Proceedings Volume 7389, 73890S (2009) https://doi.org/10.1117/12.827864
KEYWORDS: Particles, Scattering, Laser scattering, Calibration, Inspection, Reflectivity, Spatial resolution, Sensors, Optical inspection, Scatter measurement

Showing 5 of 13 publications
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