Prof. Qingqing Sun
at Fudan Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 29, 2012
Proc. SPIE. 8255, Physics and Simulation of Optoelectronic Devices XX
KEYWORDS: CMOS sensors, Electrodes, Photography, Nondestructive evaluation, Photodiodes, Scanning electron microscopy, Image sensors, Transistors, Charge-coupled devices, Device simulation

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