Prof. Qi Guo Profile

Prof. Qi Guo

at XTIPC

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 18 March 2024 Paper

Study on γ-irradiation effect of silicon single photon avalanche diodes

Mingzhu Xun, Yudong Li, Mingyu Liu, Qi Guo

Proceedings Volume 13104, 1310477 (2024) https://doi.org/10.1117/12.3024942

KEYWORDS: Single photon avalanche diodes, Silicon, Ionizing radiation, Annealing, Dark current

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Proceedings Article | 12 March 2019 Paper

Hot carrier reliability of radiation hardened T-gate PD SOI NMOSFET after TID radiation

Jinghao Zhao, Jiangwei Cui, Qiwen Zheng, Hang Zhou, Xiaowen Liang, Xuefeng Yu, Qi Guo

Proceedings Volume 11023, 1102320 (2019) https://doi.org/10.1117/12.2521943

KEYWORDS: Reliability, Oxides, Silicon, Field effect transistors, Annealing, Interfaces, Resistance, Physics, Radiation effects

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Proceedings Article | 5 March 2018 Paper

Low energy proton irradiation effects on InP/InGaAs DHBTs and InP-base frequency dividers

Xingyao Zhang, Yudong Li, Qi Guo, Jie Feng

Proceedings Volume 10710, 107100C (2018) https://doi.org/10.1117/12.2315313

KEYWORDS: Heterojunctions, Optoelectronic devices, Transistors, Semiconductors, Physics, Optoelectronics integration, Microwave radiation, Amplifiers

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Proceedings Article | 5 March 2018 Paper

Changes of photoluminescence of electron beam irradiated self-assembled InAs/GaAs quantum dots

Maliya , Abuduwayiti Aierken, Yudong Li, Dong Zhou, Xiaofan Zhao, Qi Guo, Chaoming Liu

Proceedings Volume 10710, 107100I (2018) https://doi.org/10.1117/12.2317612

KEYWORDS: Luminescence, Quantum dots, Electron beams, Aerospace engineering, Optoelectronic devices, Physics

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Proceedings Article | 5 March 2018 Paper

Study the performance of star sensor influenced by space radiation damage of image sensor

Jie Feng, Yudong Li, Lin Wen, Qi Guo, Xingyao Zhang

Proceedings Volume 10710, 107100H (2018) https://doi.org/10.1117/12.2317415

KEYWORDS: Star sensors, Stars, CCD image sensors, Image sensors, Interference (communication), Radiation effects, Charge-coupled devices, Space operations, Error analysis, Physics

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Proceedings Article | 5 March 2018 Paper

Degradation mechanism of dark signal of CCD exposed to 3MeV and 10MeV proton

Lin Wen, Yu-dong Li, Dong Zhou, Jie Feng, Qi Guo, Xing-yao Zhang, Xin Yu

Proceedings Volume 10710, 107100A (2018) https://doi.org/10.1117/12.2315065

KEYWORDS: Charge-coupled devices, Annealing, Radiation effects, Particles, CCD image sensors

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Proceedings Article | 20 February 2018 Paper

Total ionizing dose effect and damage mechanism on saturation output voltage of charge coupled device

Lin Wen, Yu-dong Li, Qi Guo, Chao-min Wang

Proceedings Volume 10697, 106971J (2018) https://doi.org/10.1117/12.2314815

KEYWORDS: Charge-coupled devices, Field effect transistors, Amplifiers, Annealing, Silicon, Gamma radiation, Radiation effects, Oxides, Semiconductors

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Showing 5 of 7 publications

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