Dr. Qi Xue
at Zhengzhou Univ
SPIE Involvement:
Publications (5)

Proceedings Article | 6 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Cameras, Structured light, Error analysis, Reliability, Image processing, Statistical analysis, Optical spheres, Image analysis, 3D metrology, Data centers

SPIE Journal Paper | 25 October 2016
OE Vol. 56 Issue 03
KEYWORDS: Reflectivity, Modulation, Phase shift keying, High dynamic range imaging, Error analysis, Optical engineering, Image processing, Phase retrieval, Nickel, Imaging systems

SPIE Journal Paper | 31 March 2014
OE Vol. 53 Issue 11
KEYWORDS: Reliability, Optical testing, Error analysis, Signal to noise ratio, Reflectivity, Optical engineering, Data processing, Gaussian filters, Image processing, Structured light

SPIE Journal Paper | 10 April 2013
OE Vol. 52 Issue 04
KEYWORDS: Calibration, Projection systems, Cameras, Distortion, Error analysis, Virtual colonoscopy, Optical testing, Imaging systems, Optical engineering, Structured light

Proceedings Article | 5 May 2012 Paper
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Calibration, Cameras, Image filtering, Projection systems, Error analysis, Digital micromirror devices, 3D metrology, Light, Image processing, Structured light

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