Prof. Qiao Feng Tan
at Tsinghua Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (54)

PROCEEDINGS ARTICLE | October 31, 2016
Proc. SPIE. 10019, Optoelectronic Devices and Integration VI
KEYWORDS: Optical fibers, Photon counting, Light sources, Light emitting diodes, Sensors, Calibration, Photomultipliers, Power supplies, Avalanche photodiodes, Light

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10154, Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation
KEYWORDS: Optical filters, Visible radiation, Waveguides

PROCEEDINGS ARTICLE | October 15, 2015
Proc. SPIE. 9673, AOPC 2015: Micro/Nano Optical Manufacturing Technologies; and Laser Processing and Rapid Prototyping Techniques
KEYWORDS: Mathematical modeling, Signal to noise ratio, Diffraction, Light sources, Light emitting diodes, Diffractive optical elements, CCD cameras, Far-field diffraction, Diodes, Optical simulations

PROCEEDINGS ARTICLE | October 15, 2015
Proc. SPIE. 9671, AOPC 2015: Advances in Laser Technology and Applications
KEYWORDS: Optical design, Diffractive optical elements, Fourier transforms, Computer simulations, Spatial light modulators, Optical tweezers, Beam shaping, Optimization (mathematics), Optical instrument design, Algorithms

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9278, Plasmonics
KEYWORDS: Diffraction, Holograms, Holography, Polarization, Wavefronts, Phase shift keying, Refraction, Antennas, Spiral phase plates, Nanorods

PROCEEDINGS ARTICLE | November 5, 2014
Proc. SPIE. 9272, Optical Design and Testing VI
KEYWORDS: Metrology, Interferometers, Calibration, Interferometry, Wavefronts, Computer generated holography, Phase retrieval, Charge-coupled devices, Chemical elements, Freeform optics

Showing 5 of 54 publications
Conference Committee Involvement (4)
Optical Design and Testing VII
12 October 2016 | Beijing, China
Optical Design and Testing VI
9 October 2014 | Beijing, China
Optical Design and Testing V
5 November 2012 | Beijing, China
Optical Design and Testing IV
18 October 2010 | Beijing, China
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