Prof. Qican Zhang
Professor/Chapter Advisor at Sichuan Univ
SPIE Involvement:
Conference Program Committee | Author | Student Chapter Advisor
Publications (39)

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Mirrors, 3D acquisition, Imaging systems, Cameras, Lamps, Xenon, 3D metrology, Projection systems, Objectives, Structured light

Proceedings Article | 16 October 2019 Paper
Proc. SPIE. 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
KEYWORDS: Imaging systems, Cameras, Calibration, Composites, Image resolution, Time metrology, 3D metrology, Projection systems, Phase measurement, Phase shifts

Proceedings Article | 16 October 2019 Paper
Proc. SPIE. 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)
KEYWORDS: Cameras, Digital filtering, Reflectivity, 3D metrology, Projection systems, Binary data, Digital Light Processing, 3D image processing, Phase shifts

SPIE Journal Paper | 14 March 2018
OE Vol. 57 Issue 03
KEYWORDS: Ronchi rulings, 3D metrology, Optical engineering, Modulation, Calibration, Cameras, Fringe analysis, Data processing, Lithium, Fourier transforms

Proceedings Article | 24 October 2017 Paper
Proc. SPIE. 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
KEYWORDS: Mirrors, Fringe analysis, Metrology, Reflection, Calibration, Photogrammetry, Deflectometry

Showing 5 of 39 publications
Conference Committee Involvement (5)
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
3D Measurement Technology for Intelligent Manufacturing
4 June 2017 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
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