Qijian Wan
Application Engineer at Mentor Graphics Shanghai Electronic Technology Co
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 20 March 2019
Proc. SPIE. 10962, Design-Process-Technology Co-optimization for Manufacturability XIII
KEYWORDS: Logic, Databases, Metals, Design for manufacturing, Image classification, Standards development, Library classification systems, Back end of line, Front end of line

Proceedings Article | 20 March 2019
Proc. SPIE. 10962, Design-Process-Technology Co-optimization for Manufacturability XIII
KEYWORDS: Data modeling, Copper, Manufacturing, Chemical vapor deposition, 3D modeling, Semiconducting wafers, Process modeling, Chemical mechanical planarization, Back end of line, Design for manufacturability

Proceedings Article | 20 March 2019
Proc. SPIE. 10962, Design-Process-Technology Co-optimization for Manufacturability XIII
KEYWORDS: Oxides, Polishing, Data modeling, Calibration, Manufacturing, 3D modeling, Transmission electron microscopy, Process modeling, Chemical mechanical planarization, Front end of line

Proceedings Article | 20 March 2019
Proc. SPIE. 10962, Design-Process-Technology Co-optimization for Manufacturability XIII
KEYWORDS: Lithography, Logic, Roads, Visualization, Databases, Manufacturing, Computer simulations, Image classification, Library classification systems

Proceedings Article | 20 March 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Statistical analysis, Visualization, Error analysis, Silicon, Manufacturing, Feature extraction, Microelectronics, Integrated circuits, Optical proximity correction

Showing 5 of 12 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top