Qimeng Tan
at Beijing Univ of Posts and Telecommunications
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | November 12, 2010
Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications
KEYWORDS: Mirrors, Reticles, Interferometers, Calibration, Image processing, Control systems, Telecommunications, Autocollimators, Information technology, Charge-coupled devices

PROCEEDINGS ARTICLE | February 3, 2009
Proc. SPIE. 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
KEYWORDS: Mirrors, Reticles, Imaging systems, Interferometers, Calibration, Image processing, CCD cameras, Autocollimation, Autocollimators, Charge-coupled devices

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