Qin TAN
at Beijing Jiaotong University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 January 2017 Paper
Proceedings Volume 10322, 103220B (2017) https://doi.org/10.1117/12.2265471
KEYWORDS: Finite element methods, Metals, Electronics engineering, Failure analysis, Reliability, 3D modeling, Lithium, Control systems, Standards development, Capacitors

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top