Mr. Qingbing Yu
at Shanghai Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Statistical analysis, Imaging systems, Cameras, Calibration, Image segmentation, Distortion, 3D modeling, Reconstruction algorithms, Environmental sensing, 3D image processing

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