Prof. Qinggang Liu
at
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Publications (9)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10622, 2017 International Conference on Optical Instruments and Technology: Micro/Nano Photonics: Materials and Devices
KEYWORDS: Beam splitters, Metrology, Gaussian beams, Photon polarization, Modulation, Polarization, Glasses, Photons, Solids, Chaos

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Mathematical modeling, Thin films, Prisms, Beam splitters, Light sources, Surface plasmons, Modulation, Polarization, Reflection, Sensors, Metals, Reflectivity, Polarizers, Algorithm development

PROCEEDINGS ARTICLE | September 15, 2016
Proc. SPIE. 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
KEYWORDS: Gold, Thin films, Prisms, Surface plasmons, Reflection, Metals, Dielectrics, Electrons, Interfaces, Reflectance spectroscopy

PROCEEDINGS ARTICLE | October 8, 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Optical components, Laser sources, Diffraction, Prisms, Spectroscopy, Optical testing, Collimation, Ronchi rulings, Charge-coupled devices, Diffraction gratings

PROCEEDINGS ARTICLE | December 31, 2008
Proc. SPIE. 7130, Fourth International Symposium on Precision Mechanical Measurements
KEYWORDS: Optical filters, Prisms, Modulation, Sensors, Calibration, Reflectivity, Interference (communication), Photodiodes, Signal processing, Electronic filtering

PROCEEDINGS ARTICLE | October 28, 2006
Proc. SPIE. 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation
KEYWORDS: Nanostructures, Titanium, Sputter deposition, Electrodes, Atomic force microscopy, Humidity, Transistors, Atomic force microscope, Nanolithography, Oxidation

Showing 5 of 9 publications
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