Dr. Qingguo Tian
at Tianjin Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 2 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: 3D acquisition, Data modeling, Speckle, Cameras, Sensors, Clouds, 3D modeling, Speckle pattern, 3D metrology, Optical simulations

Proceedings Article | 2 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Semiconductors, Light sources, Imaging systems, Image segmentation, Inspection, Digital cameras, Image enhancement, Semiconducting wafers, Light, Defect inspection

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