Qinghua Wu
at Hubei Univ of Technology
SPIE Involvement:
Publications (6)

Proceedings Article | 31 January 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Optical testing, CCD image sensors, Sensors, Calibration, Control systems, Charge-coupled devices, Cameras, Measurement devices, Time metrology, Image resolution

Proceedings Article | 12 January 2009
Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

Proceedings Article | 31 December 2008
Proc. SPIE. 7130, Fourth International Symposium on Precision Mechanical Measurements
KEYWORDS: 3D metrology, 3D image processing, Machine vision, Image processing, Computing systems, Digital cameras, Manufacturing, Inspection, Image acquisition, Sensors

Proceedings Article | 25 October 2006
Proc. SPIE. 6280, Third International Symposium on Precision Mechanical Measurements
KEYWORDS: Image acquisition, Inspection, Image processing, Image filtering, Machine vision, Charge-coupled devices, Image quality, Detection and tracking algorithms, Imaging systems, CCD cameras

Proceedings Article | 23 February 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: 3D modeling, CCD cameras, Projection systems, Phase shifts, Digital Light Processing, Data modeling, Optical fabrication, 3D image processing, Charge-coupled devices, Structured light

Showing 5 of 6 publications
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